Description
Direct effect of RF electric field was identified with RF perturbation experiment on FA negative ion source. We found (1) the beamlet width and beamlet axis position oscillate with RF frequency, (2) the amplitude of beamlet width is proportional to RF electric field and to the gradient of the perveance curve d<wx>/dPerv. We also discuss about how to suppress the oscillation of the beamlet in RF negative ion sources.
Authors
Dr
Haruhisa Nakano
(National Institute for Fusion Science)
Dr
Katsuyoshi Tsumori
Dr
Kazunori Takahashi
(Tohoku Univ.)
Kenichi Nagaoka
(National Institute for Fusion Science)
Prof.
Kenji Miyamoto
(Naruto Univ. Edu.)
Dr
Kisaki Masashi
(NIFS, QST)
Masaki Osakabe
(National Institute for Fusion Science)
Mr
Ryoya Nakamoto
Mr
Taiga Hamajima
(Nagoya Univ.)
Prof.
Ursel Fantz
(MaxPlanck Institute)